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dc.contributor.authorÖksüzoğlu, Ramis Mustafa
dc.contributor.authorYıldırım, Mustafa
dc.contributor.authorÇınar, Hakan
dc.contributor.authorHildebrandt, E.
dc.contributor.authorAlff, L.
dc.date.accessioned2019-10-22T16:59:23Z
dc.date.available2019-10-22T16:59:23Z
dc.date.issued2011
dc.identifier.issn0304-8853
dc.identifier.urihttps://dx.doi.org/10.1016/j.jmmm.2011.02.021
dc.identifier.urihttps://hdl.handle.net/11421/21837
dc.description.abstractA systematic investigation has been done on the correlation between texture, grain size evolution and magnetic properties in Ta/Ni 81Fe19/Ir20Mn80/Co 90Fe10/Ta exchange bias in dependence of Ta buffer and NiFe seed layer thickness in the range of 210 nm, deposited by pulsed DC magnetron sputtering technique. A strong dependence of <1 1 1> texture on the Ta/NiFe thicknesses was found, where the reducing and increasing texture was correlated with exchange bias field and unidirectional anisotropy energy constant at both NiFe/IrMn and IrMn/CoFe interfaces. However, a direct correlation between average grain size in IrMn and Hex and H c was not observed. L12 phase IrMn3 could be formed by thickness optimization of Ta/NiFe layers by deposition at room temperature, for which the maximum exchange coupling parameters were achieved. We conclude finally that the coercivity is mainly influenced by texture induced interfacial effects at NiFe/IrMn/CoFe interfaces developing with Ta/NiFe thicknesses.en_US
dc.description.sponsorshipFirat University Scientific Research Projects Management Unit: BAP-050255 DPT-2004-06 MAG-106M517en_US
dc.description.sponsorshipThis work was partially supported by TUBITAK under Grant no MAG-106M517 , Directorate for Scientific Research Projects of University Anadolu under Grant no BAP-050255 and Prime Ministry State Planning Organization under Grant no DPT-2004-06 .en_US
dc.language.isoengen_US
dc.relation.isversionof10.1016/j.jmmm.2011.02.021en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectMagnetic Anisotropyen_US
dc.subjectMagnetic Properties Of Monolayers And Thin Filmsen_US
dc.subjectPulsed Dc Magnetron Sputteringen_US
dc.subjectTextureen_US
dc.titleEffect of Ta buffer and NiFe seed layers on pulsed-DC magnetron sputtered Ir20Mn80/Co90Fe10 exchange biasen_US
dc.typearticleen_US
dc.relation.journalJournal of Magnetism and Magnetic Materialsen_US
dc.contributor.departmentAnadolu Üniversitesi, Mühendislik Fakültesi, Malzeme Bilimi ve Mühendisliği Bölümüen_US
dc.identifier.volume323en_US
dc.identifier.issue13en_US
dc.identifier.startpage1827en_US
dc.identifier.endpage1834en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorÖksüzoğlu, Ramis Mustafa


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