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dc.contributor.authorGacav, Caner
dc.contributor.authorBenligiray, Burak
dc.contributor.authorTopal, Cihan
dc.date.accessioned2019-10-21T20:11:45Z
dc.date.available2019-10-21T20:11:45Z
dc.date.issued2016
dc.identifier.isbn978-1-5090-1679-2
dc.identifier.urihttps://hdl.handle.net/11421/20310
dc.description24th Signal Processing and Communication Application Conference (SIU) -- MAY 16-19, 2016 -- Zonguldak, TURKEYen_US
dc.descriptionWOS: 000391250900347en_US
dc.description.abstractFacial expression recognition is an important computer vision problem with various applications. In this study, we investigate the effectiveness of features derived from facial landmarks in facial expression recognition. Distances between two combinations of facial landmarks constitute a distance vector. Features we use are the changes in the distance vectors extracted from expressive and neutral states of the face. The obtained feature vector contains elements that are relatively useless in expression recognition. By applying forward sequential feature selection, a subset of the most effective elements is formed. The chosen features are classified using a multi-class support vector machine. The performance of the proposed method is measured using Extended Cohn-Kanade dataset with seven expressions (anger, contempt, disgust, fear, happy, sad and surprised) and resulted in 89.9% mean class recognition accuracy.en_US
dc.description.sponsorshipIEEE, Bulent Ecevit Univ, Dept Elect & Elect Engn, Bulent Ecevit Univ, Dept Biomed Engn, Bulent Ecevit Univ, Dept Comp Engnen_US
dc.language.isoturen_US
dc.publisherIEEEen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectFacial Expression Recognitionen_US
dc.subjectFeature Selectionen_US
dc.subjectCohn-Kanade Dataseten_US
dc.subjectForward Sequential Feature Selectionen_US
dc.subjectSupport Vector Machinesen_US
dc.titleSequential Forward Feature Selection for Facial Expression Recognitionen_US
dc.typeconferenceObjecten_US
dc.relation.journal2016 24th Signal Processing and Communication Application Conference (Siu)en_US
dc.contributor.departmentAnadolu Üniversitesi, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümüen_US
dc.identifier.startpage1481en_US
dc.identifier.endpage1484en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorBenligiray, Burak
dc.contributor.institutionauthorTopal, Cihan


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