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dc.contributor.authorTaşköprü, T.
dc.contributor.authorBayansal, F.
dc.contributor.authorŞahin, B.
dc.contributor.authorZor, Muhsin
dc.date.accessioned2019-10-20T09:14:10Z
dc.date.available2019-10-20T09:14:10Z
dc.date.issued2015
dc.identifier.issn1478-6435
dc.identifier.issn1478-6443
dc.identifier.urihttps://dx.doi.org/10.1080/14786435.2014.984788
dc.identifier.urihttps://hdl.handle.net/11421/17175
dc.descriptionWOS: 000346846700003en_US
dc.description.abstractIn this study, transparent thin films of un-doped and Co-doped nickel oxide were deposited onto microscopic glass substrates using the successive ionic layer adsorption and reaction (SILAR) method. The effect of cobalt doping on structural, morphological and optical properties was investigated. XRD studies reveal that all the films are polycrystalline with cubic structure and exhibit (1 1 1) and (2 2 2) preferential orientations. Co is well incorporated in the host lattice without altering the structure. All films retain high transparency throughout the visible spectral regime. No significant shift in Raman spectra was observed due to the Co doping.en_US
dc.language.isoengen_US
dc.publisherTaylor & Francis LTDen_US
dc.relation.isversionof10.1080/14786435.2014.984788en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectNickel Oxideen_US
dc.subjectRamanen_US
dc.subjectSilaren_US
dc.subjectCo-Dopingen_US
dc.titleStructural and optical properties of Co-doped NiO films prepared by SILAR methoden_US
dc.typearticleen_US
dc.relation.journalPhilosophical Magazineen_US
dc.contributor.departmentAnadolu Üniversitesi, Fen Fakültesi, Fizik Bölümüen_US
dc.identifier.volume95en_US
dc.identifier.issue1en_US
dc.identifier.startpage32en_US
dc.identifier.endpage40en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.contributor.institutionauthorZor, Muhsin


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