dc.contributor.author | Çağlar, Yasemin | |
dc.contributor.author | Ilıcan, Saliha | |
dc.contributor.author | Çağlar, Müjdat | |
dc.date.accessioned | 2019-10-20T09:03:07Z | |
dc.date.available | 2019-10-20T09:03:07Z | |
dc.date.issued | 2017 | |
dc.identifier.issn | 2083-134X | |
dc.identifier.uri | https://dx.doi.org/10.1515/msp-2017-0091 | |
dc.identifier.uri | https://hdl.handle.net/11421/16628 | |
dc.description | WOS: 000428376200019 | en_US |
dc.description.abstract | In this study, the effect of boron (B) incorporation into zinc oxide (ZnO) has been investigated. The undoped, 2 at.%. and 4 at.% B doped ZnO films were deposited on p-type silicon (Si) substrates by electrodeposition method using chronoamperometry technique. Electrochemical depositions were performed by applying a constant potentiostatic voltage of 1.1 V for 180 min at 90 degrees C bath temperature. To analyze the surface morphology, field emission scanning electron microscopy (FESEM) was used and the results revealed that while a small amount of boron resulted in smoother surface, a little more incorporation of boron changed the surface morphology to dandelion-like shaped rods on the whole surface. By using X-ray diffraction (XRD) analysis, the crystal structures of the films were detected and the preferred orientation of the ZnO, which exhibited polycrystalline and hexagonal wurtzite structure, changed with B doping. For the estimation of the optical band gap of obtained films, UV-Vis diffuse reflectance spectra (DRS) of the films were taken at room temperature and these data were applied to the Kubelka-Munk function. The optical band gap of ZnO narrowed due to incorporation of B, which was confirmed by red-shift. | en_US |
dc.description.sponsorship | Anadolu University Commission of Scientific Research Projects [1207F118, 1305F082] | en_US |
dc.description.sponsorship | This work was supported by the Anadolu University Commission of Scientific Research Projects under the Grants No. 1207F118 and 1305F082. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | De Gruyter Poland Sp Zoo | en_US |
dc.relation.isversionof | 10.1515/msp-2017-0091 | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject | B Doped Zno | en_US |
dc.subject | Electrodeposition | en_US |
dc.subject | Rod-Shaped Morphology | en_US |
dc.subject | Kubelka-Munk | en_US |
dc.title | FESEM, XRD and DRS studies of electrochemically deposited boron doped ZnO films | en_US |
dc.type | article | en_US |
dc.relation.journal | Materials Science-Poland | en_US |
dc.contributor.department | Anadolu Üniversitesi, Fen Fakültesi, Fizik Bölümü | en_US |
dc.identifier.volume | 35 | en_US |
dc.identifier.issue | 4 | en_US |
dc.identifier.startpage | 824 | en_US |
dc.identifier.endpage | 829 | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.contributor.institutionauthor | Çağlar, Yasemin | |
dc.contributor.institutionauthor | Ilıcan, Saliha | |
dc.contributor.institutionauthor | Çağlar, Müjdat | |