| dc.contributor.author | Turan, Servet | |
| dc.contributor.author | Knowles, K. M. | |
| dc.date.accessioned | 2019-10-20T07:59:53Z | |
| dc.date.available | 2019-10-20T07:59:53Z | |
| dc.date.issued | 1997 | |
| dc.identifier.issn | 0955-2219 | |
| dc.identifier.uri | https://hdl.handle.net/11421/15813 | |
| dc.identifier.uri | https://doi.org/10.1016/S0955-2219(97)00070-8 | en_US |
| dc.description.abstract | Inter phase boundaries between hexagonal boron nitride and Q-Si3N4 in hot isostatically pressed Si3N4-SiC particulate composites, in which boron nitride appears as a trace contaminant, have been examined using high resolution transmission electron microscopy. A number of characteristic orientation relationships were observed between these two phases. Significantly, high resolution transmission electron microscopy showed that the interphase boundaries tended not to contain any intergranular films | en_US |
| dc.language.iso | eng | en_US |
| dc.relation.isversionof | 10.1016/S0955-2219(97)00070-8 | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.title | Interphase boundaries between hexagonal boron nitride and beta silicon nitride in silicon nitride-silicon carbide particulate composites | en_US |
| dc.type | article | en_US |
| dc.relation.journal | Journal of the European Ceramic Society | en_US |
| dc.contributor.department | Anadolu Üniversitesi, Fen Bilimleri Enstitüsü, Seramik Mühendisliği Anabilim Dalı | en_US |
| dc.identifier.volume | 17 | en_US |
| dc.identifier.issue | 15-16 | en_US |
| dc.identifier.startpage | 1849 | en_US |
| dc.identifier.endpage | 1854 | en_US |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
| dc.contributor.institutionauthor | Turan, Servet | |
