Konu "High Resolution Electron Microscopy" için Bildiri Koleksiyonu listeleme
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Wetting and non-wetting behaviour of silicon carbide grain boundaries
(Transtec Publications LTD, 1999)Silicon carbide (SiC) grain boundaries have been observed to be free from intergranular films. On the basis of equilibrium film thickness calculations, it has been proposed elsewhere that because SiC has very high refractive ...