Konu "X-Ray Reflectometry" için Araştırma Çıktıları | TR-Dizin | WoS | Scopus | PubMed listeleme
Toplam kayıt 3, listelenen: 1-3
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Determination of thickness, density and roughness of Co-Ni-Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates
(2006)Thickness, density, surface and interface roughness of Al-Co-Ni single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates were investigated using X-ray reflectivity (XRR). The ... -
Structural and Electrical Properties of Specular Spin Valve with CuOx Spacer.
(Int Union Crystallography, 2009)… -
Thickness Optimization of Underlayer and Seed Layer for Spin Valves.
(Int Union Crystallography, 2009)…