Yazar "Yıldız, I." için listeleme
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Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation
Yerci, S.; Yıldız, I.; Kulakcı, Mustafa; Serincan, Uğur; Barozzi, M.; Bersani, M.; Turan, R. (Amer Inst Physics, 2007)Depth profiles of Si nanocrystals formed in sapphire by ion implantation and the effect of charging during X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS) measurements have been studied. ... -
Structural and optical properties of Al2O3 with Si and Ge nanocrystals
Yerci, S.; Yıldız, I.; Seyhan, A.; Kulakçı, M.; Serincan, Uğur; Shandalov, M.; Turan, R. (2007)Si and Ge nanocrystals were formed in Al2O3 matrix by ion implantation and subsequent annealing. The phase separation of the Si nanocrystals was observed using X-ray photoelectron spectroscopy by monitoring Si 2p electrons. ...
